By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to trying out and diagnostics. thoughts are rather vulnerable to defects given that they make the most the expertise limits to get the top density. This e-book is a useful consultant to the trying out and diagnostics of the most recent new release of SRAM, essentially the most commonly utilized different types of reminiscence. Classical tools for trying out reminiscence are designed to address the so-called "static faults," yet those try strategies aren't enough for faults which are rising within the most up-to-date Very Deep Sub-Micron (VDSM) applied sciences. those new fault versions, often called "dynamic faults", usually are not coated by way of classical try out recommendations and require the devoted try out sequences awarded during this book.
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Extra resources for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel